Instruments

Micro zone spectrum detection system

Instrument model: FNC86A20/F15ME
Instrument number: 94102200
Purchase date: 2010-12-01
Instrument nationality: Japan
manufacturers: Japan Leica Company
place: Take 1009 room
Responsible for personnel: ming zhang

 



SM - IT300 scanning electron microscopy (sem) is a Japanese electronics co., LTD manufacture a tungsten filament scanning electron microscopy (sem) of the latest development, JMS - IT300 is a high-performance, multi-functional, multi-purpose tungsten filament scanning electron microscopy (sem).Subversive fashion design are particularly eye-catching.To touch screen operation control, simplicity, and the operating electron microscopy was like playing with mobile phones.