Instruments
Micro zone spectrum detection system
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SM - IT300 scanning electron microscopy (sem) is a Japanese electronics co., LTD manufacture a tungsten filament scanning electron microscopy (sem) of the latest development, JMS - IT300 is a high-performance, multi-functional, multi-purpose tungsten filament scanning electron microscopy (sem).Subversive fashion design are particularly eye-catching.To touch screen operation control, simplicity, and the operating electron microscopy was like playing with mobile phones.